Structural characterization of SiO2 and Al2O 3 zener-pinned nanocrystalline TiO2 by NMR, XRD and electron microscopy

Journal of Physical Chemistry C

Volumn 111, Issue 37, 2007, Pages 13740-13746

  O'Dell, Luke A ^a   Savin, Shelley L P ^b   Chadwick, Alan V ^b   Smith, Mark E ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b UNIVERSITY OF KENT   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CHARACTERIZATION; CRYSTAL GROWTH; ELECTRON MICROSCOPY; NUCLEAR MAGNETIC RESONANCE; SILICA; SOL-GEL PROCESS; TITANIUM DIOXIDE; ZENER EFFECT;

NANOCRYSTAL GROWTH; RELAXATION TIME MEASUREMENTS; ZENER PINNING;

NANOCRYSTALLINE MATERIALS;

EID: 34948831612     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp0739871     Document Type: Article

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