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Volumn , Issue , 2006, Pages 305-306

Pattern-based reengineering of software systems

Author keywords

[No Author keywords available]

Indexed keywords


EID: 34948815586     PISSN: 10951350     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCRE.2006.42     Document Type: Conference Paper
Times cited : (6)

References (9)
  • 3
    • 84949942869 scopus 로고
    • Story diagrams: A new graph rewrite language based on the unified modeling language
    • th International Workshop on Theory and Application of Graph Transformation TAGT, Paderborn, Germany, Springer Verlag, November
    • th International Workshop on Theory and Application of Graph Transformation (TAGT), Paderborn, Germany, LNCS 1764, pages 296-309. Springer Verlag, November 1998.
    • (1764) LNCS , pp. 296-309
    • Fischer, T.1    Niere, J.2    Torunski, L.3    Zündorf, A.4
  • 7
    • 33749040864 scopus 로고    scopus 로고
    • Product metrics for automatic identification of bad smell design problems in java source-code
    • Washington, DC, USA, IEEE Computer Society
    • M. J. Munro. Product metrics for automatic identification of bad smell design problems in java source-code. In METRICS '05: Proceedings of the 11th IEEE International Software Metrics Symposium (METRICS'05), page 15, Washington, DC, USA, 2005. IEEE Computer Society.
    • (2005) METRICS '05: Proceedings of the 11th IEEE International Software Metrics Symposium (METRICS'05) , pp. 15
    • Munro, M.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.