Surface studies by scanning tunneling microscopy

Physical Review Letters

Volumn 49, Issue 1, 1982, Pages 57-61

  Binning, G ^a   Rohrer, H ^a   Gerber, Ch ^a   Weibel, E ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34848919386     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.49.57     Document Type: Article

References (18)

1. Proceedings of the Sixteenth International Conference on Low-Temperature Physics, Los Angeles, 19-25 August 1981
2. Electron Emission in Intense Electric Fields