Availability analysis of a generalized maintainable three-state device parallel system with human error and common-cause failures

Journal of Quality in Maintenance Engineering

Volumn 13, Issue 4, 2007, Pages 411-432

  Dhillon, B S ^a   Shah, Aashish S ^a  

^a UNIVERSITY OF OTTAWA   (Canada)

Author keywords

Error handling; Markov processes; Operating systems; Quality control

Indexed keywords

COMPUTER OPERATING SYSTEMS; ERROR ANALYSIS; MARKOV PROCESSES; QUALITY CONTROL;

ERROR HANDLING; SYSTEM AVAILABILITY; THREE-STATE DEVICE SYSTEMS;

PARALLEL PROCESSING SYSTEMS;

EID: 34848911660     PISSN: 13552511     EISSN: None     Source Type: Journal    
DOI: 10.1108/13552510710829498     Document Type: Article

References (10)

1. Dhillon, B.S. (1975), "The analysis of the reliability of multi-state device networks", PhD dissertation, available from the National Library of Canada, Ottawa.
2. Dhillon, B.S. (1978), "A K-out-of N three-state devices system with common-cause failures", Microelectronics and Reliability, Vol. 18, pp. 447-8.
3. Dhillon, B.S. (1999), Design Reliability: Fundamentals and Applications, CRC Press, Boca Raton, FL.
4. Dhillon, B.S. and Singh, C. (1981), Engineering Reliability: New Techniques and Applications, Wiley, New York, NY.
5. Gupta, P.P., Singhal, A. and Srivastava, G.S. (1990), "Reliability and MTTF analysis of a three-state multi-component parallel redundant system under overloading effect and waiting", Microelectronics and Reliability, Vol. 33 No. 5, pp. 861-4.
6. Lesanovsky, A. (1993), "Systems with two dual failure modes: a survey", Microelectronics and Reliability, Vol. 33, pp. 1597-626.
7. Levitin, G. (2003), "Reliability of multi-state systems with two failure modes", IEEE Transactions on Reliability, Vol. 52 No. 3, pp. 340-8.
8. Levitin, G. and Lusnianski, A. (2001), "Optimal separation of elements in vulnerable multi-state systems", Reliability Engineering and System Safety, Vol. 73, pp. 55-66.
9. Proctor, C.L. and Dhillon, B.S. (1975), "Reliability of three-state device networks", Proceedings of the Annual Reliability and Maintainability Symposium, pp. 311-6.
10. Proctor, C.L. and Dhillon, B.S. (1976), "A repairable three-state device", IEEE Transactions on Reliability, Vol. 25, pp. 210-1.