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Volumn 78, Issue 9, 2007, Pages

Characterization of thermoelectric elements and devices by impedance spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; MATHEMATICAL MODELS; SPECTROSCOPY; THERMAL EFFECTS; THERMOELECTRICITY; TRANSMISSION LINE THEORY;

EID: 34848904772     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2775432     Document Type: Article
Times cited : (56)

References (28)
  • 10
    • 34848895093 scopus 로고    scopus 로고
    • Traverse City, MI
    • See, for example, Tellurex Corporation (www.tellurex.com), Traverse City, MI.
  • 17
    • 4444381412 scopus 로고    scopus 로고
    • L. Lopez, S. Grauby, S. Dilhaire, M. Salhi, W. Claeys, S. Lefevre, and S. Volz, Microelectron. J. 35, 797 (2004).
    • (2004) Microelectron. J. , vol.35 , pp. 797
    • Lopez, L.1
  • 21
    • 34848902588 scopus 로고    scopus 로고
    • Ph.D. thesis, Michigan State University
    • A. D. Downey, Ph.D. thesis, Michigan State University, 2006.
    • (2006)
    • Downey, A.D.1
  • 22
    • 34848871256 scopus 로고    scopus 로고
    • Ph.D. thesis, Michigan State University
    • S. Loo, Ph.D. thesis, Michigan State University, 2003.
    • (2003)
    • Loo, S.1
  • 26
    • 34848920050 scopus 로고    scopus 로고
    • See Goodfellow (http://www.goodfellow.com/), 2007.
    • (2007)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.