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Volumn 2, Issue 5, 2007, Pages 516-522
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Recent developments on high current measurement using current shunt
b
CHUO UNIVERSITY
(Japan)
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Author keywords
High power; Measurement; Short circuit test; Standard; Traceability
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Indexed keywords
INFORMATION DISSEMINATION;
SHORT CIRCUIT CURRENTS;
STANDARDS;
CURRENT SHUNT;
TRACEABILITY;
ELECTRIC CURRENT MEASUREMENT;
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EID: 34848894539
PISSN: 19314973
EISSN: 19314981
Source Type: Journal
DOI: 10.1002/tee.20203 Document Type: Review |
Times cited : (18)
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References (3)
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