Experimental technique for reducing contact and background noise in voltage spectral density measurements

Review of Scientific Instruments

Volumn 78, Issue 9, 2007, Pages

  Barone, C ^d   Galdi, A ^d   Pagano, S ^d   Quaranta, O ^d   McHin L ^a   Routoure, J M ^a   Perna, P ^b,c  

^a UNIVERSITÉ DE CAEN   (France)

^b UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

^c UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; DYNAMIC ANALYSIS; SPECTRAL DENSITY; THIN FILMS; VOLTAGE MEASUREMENT;

BACKGROUND NOISE; DYNAMIC BEHAVIORS; NOISE COMPONENTS; VOLTAGE SPECTRAL DENSITY;

SPURIOUS SIGNAL NOISE;

EID: 34848861644     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2786271     Document Type: Article

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