Wide angle crystal spectrometer for angularly and spectrally resolved x-ray scattering experiments

Review of Scientific Instruments

Volumn 78, Issue 9, 2007, Pages

  Saiz, E García ^a   Khattak, F Y ^a   Gregori, G ^b,c   Bandyopadhyay, S ^b   Clarke, R J ^b   Fell, B ^b   Freeman, R R ^d   Jeffries, J ^b   Jung, D ^b,e   Notley, M M ^b   Weber, R L ^d   Van Woerkom, L ^d   Riley, D ^a  

^a QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

^b Harwell Campus   (United Kingdom)

^c UNIVERSITY OF OXFORD   (United Kingdom)

^d OHIO STATE UNIVERSITY   (United States)

^e DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; GRAPHITE; IMAGE PROCESSING; PLASMAS; SCATTERING; X RAY SCATTERING;

LASER SHOCKED FOIL; TEMPORAL EVOLUTION; WIDE ANGLE CRYSTAL SPECTROMETER; X-RAY LINE TRANSFER;

SPECTROMETERS;

EID: 34848854772     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2783773     Document Type: Article

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