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Volumn 43, Issue 5, 2007, Pages 432-435

Ion-induced beryllium oxidation

Author keywords

[No Author keywords available]

Indexed keywords

DEUTERIUM; ELECTRON PROBE MICROANALYSIS; IRRADIATION; OXIDATION; OXYGEN; SECONDARY ION MASS SPECTROMETRY;

EID: 34848850219     PISSN: 00331732     EISSN: None     Source Type: Journal    
DOI: 10.1134/S0033173207050037     Document Type: Article
Times cited : (1)

References (10)
  • 1
    • 18344399964 scopus 로고
    • the JET Team
    • Thomas, P.R. and the JET Team, J. Nucl. Mater., 1990, vols. 176-177, p. 3.
    • (1990) J. Nucl. Mater. , vol.176-177 , pp. 3
    • Thomas, P.R.1
  • 2
    • 30244538870 scopus 로고
    • The JET Team
    • The JET Team, J. Nucl. Mater., 1992, vols. 196-198, p. 3.
    • (1992) J. Nucl. Mater. , vol.196-198 , pp. 3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.