Edge effects in buckled thin films on elastomeric substrates

Applied Physics Letters

Volumn 91, Issue 13, 2007, Pages

  Koh, C T ^a   Liu, Z J ^a   Khang, D Y ^b   Song, J ^c   Lu, C ^a   Huang, Y ^d   Rogers, J A ^b   Koh, C G ^e  

^a INSTITUTE OF HIGH PERFORMANCE COMPUTING   (Singapore)

^b University of Illinois at Urbana Champaign   (United States)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^d Northwestern University   (United States)

^e NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; BUCKLING; EDGE DETECTION; ELASTOMERS; FINITE ELEMENT METHOD; WAVE EFFECTS;

BUCKLED THIN FILMS; EDGE-EFFECT LENGTH; ELASTOMERIC SUBSTRATES; THIN-FILM THICKNESS;

THIN FILMS;

EID: 34848826496     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2791004     Document Type: Article

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