A smart load-pull method to safely reach optimal matching impedances of power transistors

IEEE MTT-S International Microwave Symposium Digest

Volumn , Issue , 2007, Pages 1489-1492

  Reveyrand, T ^a   Gasseling, T ^b   Barataud, D ^a   Mons, S ^a   Nebus J M ^a  

^a Centre National de la Recherche Scientifique   (France)

^b CTTC ESTER Technopole   (France)

Author keywords

Impedance matching; Microwave measurements; Modeling; Semiconductor device measurements

Indexed keywords

IMPEDANCE MATCHING (ELECTRIC); ITERATIVE METHODS; MATHEMATICAL MODELS; MICROWAVE MEASUREMENT; PARAMETER ESTIMATION; SEMICONDUCTOR DEVICE MANUFACTURE;

GAIN COMPRESSION; INPUT POWER; LOAD-PULL MEASUREMENT; POWER TRANSISTORS;

TRANSISTORS;

EID: 34748922934     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2007.380535     Document Type: Conference Paper

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