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Volumn 7, Issue 9, 2007, Pages 1584-1589

Crystal perfection in zinc oxide with occluded carboxyl-functionalized latex particles

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Indexed keywords


EID: 34748901338     PISSN: 15287483     EISSN: None     Source Type: Journal    
DOI: 10.1021/cg060858l     Document Type: Conference Paper
Times cited : (38)

References (36)
  • 1
    • 0004200336 scopus 로고    scopus 로고
    • Oxford University Press: New York
    • Mann, S. Biomineralization; Oxford University Press: New York, 2001.
    • (2001) Biomineralization
    • Mann, S.1
  • 2
    • 34748903387 scopus 로고    scopus 로고
    • Mineralogical Society of America, Geochemical Society: Washington, DC
    • Dove, P. M.; De Yoreo, J. J.; Weiner, S. Biomineralization; Mineralogical Society of America, Geochemical Society: Washington, DC, 2003; Vol. 54.
    • (2003) Biomineralization , vol.54
    • Dove, P.M.1    De Yoreo, J.J.2    Weiner, S.3
  • 21
    • 34748827276 scopus 로고    scopus 로고
    • Powder diffraction file, card 36-1451, JCPDS-ICDD (Joint Commitee on Powder Diffraction Standards-International Center for Diffraction Data), Swarthmore, 1996.
    • Powder diffraction file, card 36-1451, JCPDS-ICDD (Joint Commitee on Powder Diffraction Standards-International Center for Diffraction Data), Swarthmore, 1996.
  • 22
    • 0011460494 scopus 로고
    • Optical properties of zinc oxide
    • Kaldis, E, Ed, North-Holland Publishing Company: Amsterdam
    • Kolb, D. M.; Schulz, H.-J. Optical properties of zinc oxide. In Current Topics in Materials Science; Kaldis, E., Ed.; North-Holland Publishing Company: Amsterdam, 1981; Vol. 7; pp 226-268.
    • (1981) Current Topics in Materials Science , vol.7 , pp. 226-268
    • Kolb, D.M.1    Schulz, H.-J.2
  • 24
    • 34748910525 scopus 로고    scopus 로고
    • From measurements of a silicion standard, it has been estimated that for the diffractometer used in our experiments from real values could be up to 30% larger than those calculated by the Scherrer formula without taking into account instrumental broadenings.
    • From measurements of a silicion standard, it has been estimated that for the diffractometer used in our experiments from real values could be up to 30% larger than those calculated by the Scherrer formula without taking into account instrumental broadenings.
  • 25
    • 0004326059 scopus 로고    scopus 로고
    • International Union of Crystallography; Oxford University Press: Oxford
    • Young, R. A. The Rietveld Method; International Union of Crystallography; Oxford University Press: Oxford, 1996; p 298.
    • (1996) The Rietveld Method , pp. 298
    • Young, R.A.1
  • 26
    • 34748924110 scopus 로고    scopus 로고
    • The X-ray diffractometer used in the data shown in Table 2 and Figure 5, equipped with a chamber for temperature control, was different from the one used for the conventional measurements at room temperature shown in Table 1 and Figure 4. This explains the slight differences between the values at room temperature. Comparison of the absolute values can only be done for measurements carried out in the same device (i.d., within the same table or figure).
    • The X-ray diffractometer used in the data shown in Table 2 and Figure 5, equipped with a chamber for temperature control, was different from the one used for the conventional measurements at room temperature shown in Table 1 and Figure 4. This explains the slight differences between the values at room temperature. Comparison of the absolute values can only be done for measurements carried out in the same device (i.d., within the same table or figure).


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