Through-thickness characterization of microstructure and texture in high purity aluminum processed to high strain by accumulative roll-bonding

Materials Transactions

Volumn 48, Issue 8, 2007, Pages 1978-1985

  Kamikawa, Naoya ^a,b   Tsuji, Nobuhiro ^a   Huang, Xiaoxu ^b   Hansen, Niels ^b  

^a OSAKA UNIVERSITY   (Japan)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Accumulative roll bonding (ARB); High purity aluminum; Local texture; Microstructure; Ultrafine grains

Indexed keywords

ALUMINUM; BACKSCATTERING; ELECTRON DIFFRACTION; ROLL BONDING; STRAIN RATE; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

ACCUMULATIVE ROLL BONDING (ARB); HIGH PURITY ALUMINUM; LOCAL TEXTURE; ULTRAFINE GRAINS;

MICROSTRUCTURE;

EID: 34748891679     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.MA200702     Document Type: Article

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