Electric loading - Induced cracking behavior at electrode edges in PZT ceramics

Key Engineering Materials

Volumn 352, Issue , 2007, Pages 267-270

  Kusukawa, Kazuhiro ^a   Shiozaki, Yohei ^a  

^a KOCHI UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

Domain switching; Fatigue damage; FEM analysis; Intergranular cracking; Permittivity; PZT

Indexed keywords

CRACK INITIATION; ELECTRIC FIELD EFFECTS; ELECTRIC LOADS; ELECTROCHEMICAL ELECTRODES; FATIGUE DAMAGE; LEAD COMPOUNDS; PERMITTIVITY;

DOMAIN SWITCHING; ELECTRIC LOADING; INTERGRANULAR CRACKING;

CERAMIC MATERIALS;

EID: 34748889122     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/0-87849-454-5.267     Document Type: Conference Paper

References (4)

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2. Y. Shindo, M. Yoshida, F. Narita and K. Horiguchi: Journal of the Mechanics and Physics of Solids Vol. 52 (2004), p.1109
3. A. G. Tobin and Y. E. Pak, in: Proc. of SPIE (1993), p. 1996
4. Z. K. Zhang, D. F. Fang and A. K. Soh: Mechanics of Materials, Vol. 38 (2006), p. 25