Molecular beam epitaxial growth of EuTe/SnTe strained superlattices

Journal of Crystal Growth

Volumn 308, Issue 1, 2007, Pages 218-222

  Díaz, Beatriz ^a   Henrique Oliveira Rappl, Paulo ^a   Abramof, Eduardo ^a  

^a INSTITUTO NACIONAL DE PESQUISAS ESPACIAIS   (Brazil)

Author keywords

A1. High resolution X ray diffraction; A1. Reflection high energy electron diffraction; A3. Molecular beam epitaxy; A3. Superlattices; B2. Semiconducting materials

Indexed keywords

MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; STRAIN RATE; SUPERLATTICES; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

HETEROSTRUCTURE CRYSTALLINE QUALITY; HIGH RESOLUTION X-RAY DIFFRACTION; STRANSKI-KRASTANOV MODES; VOLMER-WEBER MODES;

EPITAXIAL GROWTH;

EID: 34748832174     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.07.044     Document Type: Article

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