A simple microwave technique for determination of complex permittivity and thickness of high-loss planar samples

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn , Issue , 2007, Pages

  Hasar, U C ^a,b   Westgate, C R ^b  

^a ATATÜRK UNIVERSITY   (Turkey)

^b State University of New York   (United States)

Author keywords

High loss materials; Microwave measurements; Rectangular waveguides; Variational frequency

Indexed keywords

ERROR ANALYSIS; FREQUENCY SHIFT KEYING; LARGE SCALE SYSTEMS; RECTANGULAR WAVEGUIDES; SAMPLING; VARIATIONAL TECHNIQUES;

COMPLEX PERMITTIVITY; FREQUENCY RANGE; HIGH-LOSS MATERIALS; MICROWAVE MEASUREMENTS; VARIATIONAL FREQUENCY;

PERMITTIVITY MEASUREMENT;

EID: 34648830175     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/imtc.2007.379192     Document Type: Conference Paper

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