Dual energy volumetric X-ray tomographic sensor for luggage screening

Proceedings of the 2007 IEEE Sensors Applications Symposium, SAS

Volumn , Issue , 2007, Pages

  Ying, Zhengrong ^a   Naidu, Ram ^a   Guilbert, Kyle ^a   Schafer, David ^a   Crawford, Carl R ^a  

^a ANALOGIC CORPORATION   (United States)

Author keywords

Compton scatter; Computed tomography; Dual energy; Effective atomic number; Photoelectric effect; Visualization

Indexed keywords

AUTOMATIC PROGRAMMING; COMPTON SCATTERING; COMPUTERIZED TOMOGRAPHY; DATA VISUALIZATION; PHOTOELECTRICITY; X RAY SCATTERING;

DUAL ENERGY; EFFECTIVE ATOMIC NUMBERS; IMAGING SENSORS; LUGGAGE SCREENING;

OPTICAL SENSORS;

EID: 34648822575     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SAS.2007.374371     Document Type: Conference Paper

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