SEIR linearity testing of precision A/D converters in nonstationary environments with center-symmetric interleaving

IEEE Transactions on Instrumentation and Measurement

Volumn 56, Issue 5, 2007, Pages 1776-1785

  Jin, Le ^a,b   Chen, Degang ^a   Geiger, Randall L ^a  

^a Iowa State University of Science and Technology   (United States)

^b NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

Analog to digital converter (ADC); Center symmetric interleaving (CSI); Differential nonlinearity (DNL); Integral nonlinearity (INL); Linearity test; Nonlinear stimulus signal; Nonstationary test environment; Stimulus error identification and removal (SEIR) algorithm

Indexed keywords

ALGORITHMS; BUILT-IN SELF TEST; CALIBRATION; COMPUTER SIMULATION; CONTROL NONLINEARITIES; SIGNAL PROCESSING;

CENTER-SYMMETRIC INTERLEAVING; NONLINEAR STIMULUS SIGNAL; NONSTATIONARY TEST ENVIRONMENT; STIMULUS ERROR IDENTIFICATION AND REMOVAL (SEIR) ALGORITHM;

ANALOG TO DIGITAL CONVERSION;

EID: 34648816126     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2007.904491     Document Type: Article

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