Measurement of silicon dioxide surface phonon-polariton propagation length by attenuated total reflection

Applied Physics Letters

Volumn 91, Issue 12, 2007, Pages

  Chen, Dye Zone A ^a   Chen, Gang ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT PROPAGATION; LIGHT REFLECTION; MEASUREMENT THEORY; SILICON COMPOUNDS; SURFACE PLASMON RESONANCE;

PHONON-POLARITONS; POLARITON PROPAGATION; SILICON DIOXIDE SURFACE PHONON-POLARITON RESONANCE;

AMORPHOUS SILICON;

EID: 34648815116     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2789177     Document Type: Article

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