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Volumn , Issue , 2007, Pages 174-176
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A 1-to-2GHz 4-phase on-chip clock generator with timing-margin test capability
a a a
a
NEC CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
ELECTRIC CLOCKS;
JITTER;
SPECTRAL RESOLUTION;
TUNING;
CLOCK-PERIOD DITHERING TECHNIQUES;
DISTURBANCE-CONTROL FUNCTIONS;
FREQUENCY TUNING RESOLUTION;
ON-CHIP CLOCK GENERATORS;
ELECTRIC GENERATORS;
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EID: 34548828226
PISSN: 01936530
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISSCC.2007.373350 Document Type: Conference Paper |
Times cited : (14)
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References (4)
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