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Volumn , Issue , 2007, Pages 324-326

A 1.1GHz 12μA/Mb-leakage SRAM design in 65nm ultra-low-power CMOS with integrated leakage reduction for mobile applications

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE EQUIPMENT; ELECTRIC POTENTIAL; MOBILE TELECOMMUNICATION SYSTEMS; STATIC RANDOM ACCESS STORAGE;

EID: 34548825093     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2007.373425     Document Type: Conference Paper
Times cited : (32)

References (6)
  • 2
    • 25844527781 scopus 로고    scopus 로고
    • Low-Power Embedded SRAM Modules with Expanded Margins for Writing
    • Feb
    • M. Yamaoka, N. Maeda, Y Shinozaki, et al., "Low-Power Embedded SRAM Modules with Expanded Margins for Writing," ISSCC Dig. Tech. Papers, pp. 480-481, Feb., 2005.
    • (2005) ISSCC Dig. Tech. Papers , pp. 480-481
    • Yamaoka, M.1    Maeda, N.2    Shinozaki, Y.3
  • 3
    • 33745118352 scopus 로고    scopus 로고
    • A Low Leakage SRAM Macro with Replica Cell Biasing Scheme
    • Jun
    • Y. Takeyama, H. Otake, O. Hirabayashi, et al., "A Low Leakage SRAM Macro with Replica Cell Biasing Scheme," Symp. VLSI Circuits, pp. 166-167, Jun., 2005.
    • (2005) Symp. VLSI Circuits , pp. 166-167
    • Takeyama, Y.1    Otake, H.2    Hirabayashi, O.3
  • 4
    • 31344466804 scopus 로고    scopus 로고
    • A Sub-0.5-V Operating Embedded SRAM Featuring a Multi-Bit-Error-Immune Hidden-ECC Scheme
    • Jan
    • T. Suzuki, Y. Yamagami, I. Hatanaka, et al., "A Sub-0.5-V Operating Embedded SRAM Featuring a Multi-Bit-Error-Immune Hidden-ECC Scheme," IEEE J. Solid-State Circuits, vol. 41, no. 1, pp. 152-160, Jan., 2006.
    • (2006) IEEE J. Solid-State Circuits , vol.41 , Issue.1 , pp. 152-160
    • Suzuki, T.1    Yamagami, Y.2    Hatanaka, I.3
  • 5
    • 33845988529 scopus 로고    scopus 로고
    • A 65nm Ultra Low Power Logic Platform Technology Using Uni-axial Strained Silicon Transistors
    • Dec
    • C.-H. Jan, P. Bai, J. Choi, et al., "A 65nm Ultra Low Power Logic Platform Technology Using Uni-axial Strained Silicon Transistors," IEDM Tech. Dig., pp. 65-66, Dec., 2005.
    • (2005) IEDM Tech. Dig , pp. 65-66
    • Jan, C.-H.1    Bai, P.2    Choi, J.3
  • 6
    • 18744365842 scopus 로고    scopus 로고
    • SRAM Design on 65-nm CMOS Technology with Dynamic Sleep Transistor for Leakage Reduction
    • Apr
    • K. Zhang, U. Bhattacharya, Z. Chen, et al., "SRAM Design on 65-nm CMOS Technology with Dynamic Sleep Transistor for Leakage Reduction," IEEE J. Solid-State Circuits, pp. 895-901, Apr., 2005.
    • (2005) IEEE J. Solid-State Circuits , pp. 895-901
    • Zhang, K.1    Bhattacharya, U.2    Chen, Z.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.