Techniques for depth heterogeneity identification in X-ray fluorescence

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 263, Issue 1 SPEC. ISS., 2007, Pages 76-78

  Trojek, T ^a   Cechak T ^a   Musilek L ^a  

^a CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

Author keywords

Coating; Heterogeneity; Monte Carlo simulation; X ray fluorescence

Indexed keywords

COMPUTATIONAL GEOMETRY; COMPUTER SIMULATION; MONTE CARLO METHODS; SPECTRUM ANALYSIS;

GEOMETRIC ARRANGEMENTS; X-RAY FLUORESCENCE ANALYSIS;

FLUORESCENCE;

EID: 34548813096     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.04.064     Document Type: Article

References (5)

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2. T. Trojek, T. Čechák, in: Proc. 6th Int. Topical Meeting on Industrial Radiation and Radioisotope Measurement Applications, Hamilton, Canada, 2005.
3. Riveros J.A., Vazquez C., and De Leyt D.V. X-ray Spectrom. 19 (1990) 93
4. Weber G., Delbrouck J.M., Strivay D., Kerff F., and Martinot L. Nucl. Instr. and Meth. B 139 (1998) 196
5. Čechák T., Gerndt J., Kopecká I., and Musílek L. Nucl. Instr. and Meth. B 213 (2004) 735