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Volumn 28, Issue 17, 2007, Pages 2961-2970

Numerical simulations of the second-order electrokinetic bias observed with the gated injection mode in chips

Author keywords

Electrokinetic injection; Gated injection; Separation chip

Indexed keywords

ELECTRIC FIELDS; ELECTRODYNAMICS; NUMERICAL MODELS; POPULATION DISTRIBUTION;

EID: 34548799817     PISSN: 01730835     EISSN: 15222683     Source Type: Journal    
DOI: 10.1002/elps.200600692     Document Type: Article
Times cited : (11)

References (36)
  • 16
    • 0003817362 scopus 로고    scopus 로고
    • van den Berg, A, Olthuis, W, Bergveld, P, Eds, Kluwer, Academic Publishers, Dordrecht, The Netherlands
    • Deshpande, M., Greinner, K. B., West, J., Gilbert, J. R. et al., in: van den Berg, A., Olthuis, W., Bergveld, P. (Eds.), Micro Total Analysis Systems, Kluwer, Academic Publishers, Dordrecht, The Netherlands 2000, pp. 339-342.
    • (2000) Micro Total Analysis Systems , pp. 339-342
    • Deshpande, M.1    Greinner, K.B.2    West, J.3    Gilbert, J.R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.