Rapid assessment of surface treatment effectiveness and degradation by direct field measurement

IEEE Aerospace Conference Proceedings

Volumn , Issue , 2007, Pages

  Rideout, Curtis A ^a   Ritchie, Scott J ^a  

^a Positron Systems Incorporated   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; NONDESTRUCTIVE EXAMINATION; RELAXATION PROCESSES; RELIABILITY ANALYSIS; RESIDUAL STRESSES; SINGLE CRYSTALS; SUPERALLOYS; SURFACE TREATMENT;

AEROSPACE STRUCTURES; COLD EXPANSION; RAPID ASSESSMENT; RELAXATION EFFECTS;

AIRCRAFT;

EID: 34548784888     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2007.352913     Document Type: Conference Paper

References (9)

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9. United States Patent Number 6,178,218 B1, "Nondestructive Examination Using Neutron Activated Positron Annihilation," January 23, 2001.