Molecular dynamics in glass-forming poly(phenyl methyl siloxane) as investigated by broadband thermal, dielectric and neutron spectroscopy

Journal of Non-Crystalline Solids

Volumn 353, Issue 41-43, 2007, Pages 3853-3861

  Schonhals A ^a   Schick, Ch ^b   Huth, H ^b   Frick, B ^c   Mayorova, M ^d   Zorn, R ^d  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b UNIVERSITY OF ROSTOCK   (Germany)

^c INSTITUT LAUE LANGEVIN   (France)

^d FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Dielectric properties; Electric modulus; Glass transition; Neutron diffraction scattering; Relaxation

Indexed keywords

DIELECTRIC RELAXATION; DIELECTRIC SPECTROSCOPY; GLASS; MOLECULAR DYNAMICS; NEUTRON SPECTROMETERS; THERMAL EFFECTS;

ELECTRIC MODULUS; GLASS-FORMING POLY(METHYL PHENYL SILOXANE) (PMPS); RELAXATION RATES;

SILICONES;

EID: 34548777621     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.03.025     Document Type: Article

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