Reliability of high-power IGBT modules for traction applications

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2007, Pages 480-485

  Ciappa, Mauro ^a,b   Castellazzi, Alberto ^a,b  

^a IEEE

^b ETH ZURICH   (Switzerland)

Author keywords

Electromagnetic simulation; IGBT; Power device reliability; Simulation; Thermal management; Traction

Indexed keywords

COMPUTER SIMULATION; HIGH TEMPERATURE APPLICATIONS; RELIABILITY THEORY; TEMPERATURE CONTROL; TRACTION (FRICTION);

ELECTROMAGNETIC SIMULATION; POWER DEVICE RELIABILITY; SYSTEM EFFICIENCY;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

EID: 34548775138     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2007.369938     Document Type: Conference Paper

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