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Volumn 129, Issue 36, 2007, Pages 11153-11160

The lanthanide contraction revisited

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; COMPLEXATION; LIGANDS; PARAMETER ESTIMATION;

EID: 34548767170     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja072750f     Document Type: Article
Times cited : (258)

References (47)
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    • (b) Yao, J.; Deng, B.; Sherry, L. J.; McFarland, A. D.; Ellis, D. E.; Van, Duyne, R. P.; Ibers, J. A. Inorg. Chem. 2004, 43, 7735-7740.
  • 27
    • 34548776720 scopus 로고    scopus 로고
    • For more details see the Supporting Information
    • For more details see the Supporting Information.
  • 28
    • 34548782449 scopus 로고    scopus 로고
    • An equivalent alternative description would be the average bond length
    • An equivalent alternative description would be the average bond length.
  • 29
    • 34548751494 scopus 로고    scopus 로고
    • σ = standard deviation.
    • σ = standard deviation.
  • 41
    • 34548754183 scopus 로고    scopus 로고
    • SMART, version 5.059: Area-Detector Software Package; Bruker Analytical X-ray Systems, Inc, Madison, WI, 1999
    • SMART, version 5.059: Area-Detector Software Package; Bruker Analytical X-ray Systems, Inc.: Madison, WI, 1999.
  • 42
    • 34548735021 scopus 로고    scopus 로고
    • SAINT, version 7.07B: SAX Area-Detector Integration Program; Siemens Industrial Automation, Inc, Madison, WI, 2005
    • SAINT, version 7.07B: SAX Area-Detector Integration Program; Siemens Industrial Automation, Inc.: Madison, WI, 2005.
  • 43
    • 34548769575 scopus 로고    scopus 로고
    • XPREP, version 6.12: Part of the SHELXTL Crystal Structure Determination Package; Bruker AXS Inc, Madison, WI, 1995
    • XPREP, version 6.12: Part of the SHELXTL Crystal Structure Determination Package; Bruker AXS Inc.: Madison, WI, 1995.
  • 44
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    • Sheldrick, G. SADABS, version 2.10: Siemens Area Detector Absorption Correction Program; University of Gottingen: Göttingen, Germany, 2005
    • Sheldrick, G. SADABS, version 2.10: Siemens Area Detector Absorption Correction Program; University of Gottingen: Göttingen, Germany, 2005.
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    • WinGX 1.70.01: Farrugia, L. J. J. Appl. Crystallogr. 1999, 32, 837-838.
    • WinGX 1.70.01: Farrugia, L. J. J. Appl. Crystallogr. 1999, 32, 837-838.
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    • SIR92: Altomare, A.; Cascarano, G.; Giacovazzo, C.; Guagliardi, A. J. Appl. Crystallogr. 1993, 26, 343-350.
    • SIR92: Altomare, A.; Cascarano, G.; Giacovazzo, C.; Guagliardi, A. J. Appl. Crystallogr. 1993, 26, 343-350.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.