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Volumn , Issue , 2007, Pages

A radiation hardened 16-Mb SRAM for space applications

Author keywords

[No Author keywords available]

Indexed keywords

AEROSPACE ENGINEERING; CHIP SCALE PACKAGES; CMOS INTEGRATED CIRCUITS; RADIATION HARDENING; SPACE APPLICATIONS;

EID: 34548726215     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2007.353100     Document Type: Conference Paper
Times cited : (18)

References (5)
  • 1
    • 34548808655 scopus 로고    scopus 로고
    • L. Rockett et. al., The Foundry Modernization at BAE SYSTEMS in Manassas VA-A Progress Report, Government Microcircuit Applications Conference (GOMAC) Digest of Technical Papers, XXIX, March 2004.
    • L. Rockett et. al., "The Foundry Modernization at BAE SYSTEMS in Manassas VA-A Progress Report", Government Microcircuit Applications Conference (GOMAC) Digest of Technical Papers, Vol. XXIX, March 2004.
  • 3
    • 11244337501 scopus 로고    scopus 로고
    • High Performance Radiation Hardened Static Random Access Memory (SRAM) Design for Space Applications
    • March
    • S. Doyle et. al., "High Performance Radiation Hardened Static Random Access Memory (SRAM) Design for Space Applications," 2004 IEEE Aerospace Conference Proceedings, March 2004.
    • (2004) 2004 IEEE Aerospace Conference Proceedings
    • Doyle, S.1    et., al.2
  • 4
    • 84861160182 scopus 로고    scopus 로고
    • A Radiation Hardened 16M SRAM for Space Applications
    • March, To Be Published
    • S. Doyle et. al., "A Radiation Hardened 16M SRAM for Space Applications," 2007 GOMAC Conference Proceedings, March 2007 (To Be Published).
    • (2007) 2007 GOMAC Conference Proceedings
    • Doyle, S.1    et., al.2
  • 5
    • 0035308547 scopus 로고    scopus 로고
    • The Impact of Intrinsic Device Fluctuations on CMOS SRAM Cell Stability, 2001
    • April
    • A. Bhavnagarwala et. al., "The Impact of Intrinsic Device Fluctuations on CMOS SRAM Cell Stability", 2001 IEEE Journal of Solid State Circuits, Vol. 36, April 2001.
    • (2001) IEEE Journal of Solid State Circuits , vol.36
    • Bhavnagarwala, A.1    et., al.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.