Survey on very fast TLP and ultra fast repetitive pulsing for characterization in the CDM-domain

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2007, Pages 324-333

  Gieser, Horst A ^a   Wolf, Heinrich ^a  

^a Fraunhofer Institute Reliability and Microintegration   (Germany)

Author keywords

CDM; Charged device model; Electrostatic discharge; ESD; Pulsed characterization; Very fast transmission line pulsing; VF TLP

Indexed keywords

ELECTROSTATIC DISCHARGE; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; TELECOMMUNICATION REPEATERS; VOLTAGE CONTROL;

CHARGED DEVICE MODEL; PULSED CHARACTERIZATION; REPETITIVE MEDIUM VOLTAGE; VERY FAST TRANSMISSION LINE PULSING;

TRANSMISSION LINE THEORY;

EID: 34548724490     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2007.369911     Document Type: Conference Paper

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