New developments of THERMOS3, a tool for 3D electro-thermal simulation of smart power MOSFETs

Microelectronics Reliability

Volumn 47, Issue 9-11 SPEC. ISS., 2007, Pages 1696-1700

  Irace, Andrea ^a   Breglio, Giovanni ^a   Spirito, Paolo ^a  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOTIVE ENGINEERING; COMPUTER SIMULATION; ENERGY DISSIPATION; MOSFET DEVICES; NETWORKS (CIRCUITS); SEMICONDUCTOR DEVICES;

ELECTRO-THERMAL SIMULATION TOOL; SMART POWER DEVICES;

MACHINE TOOLS;

EID: 34548689885     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2007.07.012     Document Type: Article

References (2)

1. Breglio G., and Spirito P. Experimental detection of time-dependent temperature maps in power bipolar transistors. Microelectron J 31 9-10 (2000) 735-739 October
2. Irace A., Breglio G., Spirito P., Letor R., and Russo S. Reliability enhancement with the aid of transient infrared thermal analysis of smart power MOSFETs during short circuit operation. Microelectron Reliab 45 9-11 (2005) 1706-1710