Predicting shuttle software reliability with parameter evaluation

Innovations in Systems and Software Engineering

Volumn 3, Issue 3, 2007, Pages 181-191

  Schneidewind, Norman F ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

RISK ASSESSMENT; SOFTWARE ENGINEERING; TESTING;

PARAMETER EVALUATION; PARAMETER RATIO METHOD; PREDICTIONS;

SOFTWARE RELIABILITY;

EID: 34548679626     PISSN: 16145046     EISSN: 16145054     Source Type: Journal    
DOI: 10.1007/s11334-007-0025-0     Document Type: Article

References (9)

1. Broklehurst S, Littlewood B (1996) In: Lyu MR (ed) Handbook of Software Reliability Engineering, Chap. 4. IEEE Computer Society Press and McGraw-Hill Book Company
2. Dijkstra E (1970) Structured programming. In: Buxton JN, Randell B (eds) Software engineering techniques. NATO Scientific Affairs Division, Brussels 39, Belgium, April 1970, pp 84-88
3. Farr WH, Smith OD Statistical modeling and estimation of reliability functions for software (SMERFS) users guide. NAVSWC TR-84-373, Revision 2, Naval Surface Warfare Center, Dahlgren
4. IEEE/AIAA P1633 ™ /Draft 5 (2006) Draft standard for software reliability prediction, prepared by the Software Reliability Engineering Working Group of the Definitions and Standards Committee of the Reliability Society, November 2006
5. Keller T, Schneidewind NF (1997) A successful application of software reliability engineering for the NASA Space shuttle. software reliability engineering case studies. In: International Symposium on Software Reliability Engineering, November 3, Albuquerque, New Mexico, November 4, 1997, pp 71-82
6. Software Safety (1997) NASA technical standard, NASA-STD-8719.13A, September 15, 1997
7. Allen Nikora, CASRE, Open Channel Foundation; http://www.openchannelfoundation.org/projects/CASRE_3.0
8. Schneidewind NF (1997) Reliability modeling for safety critical software. IEEE Trans Reliab 46(1):88-98
9. Gokhaleand SS, Trivedi KS (1998) Log-logistic software reliability growth model. In: Proceedings of the Third IEEE International High-Assurance Systems Engineering Symposium, 1998, 13-14 November 1998, pp 34-41, Washington