Broadband dielectric spectroscopic characterization of Nafion® chemical degradation

Journal of Power Sources

Volumn 172, Issue 1, 2007, Pages 72-77

  Rhoades, David W ^a   Hassan, Mohammad K ^a   Osborn, Shawn J ^a   Moore, Robert B ^a   Mauritz, Kenneth A ^a  

^a Virginia Polytechnic Institute and State University   (United States)

Author keywords

Broadband dielectric spectroscopy; Chemical degradation; Distribution of relaxation times; Nafion

Indexed keywords

CHARACTERIZATION; DEGRADATION; DIELECTRIC SPECTROSCOPY; FUEL CELLS; MICROSTRUCTURE; MOLECULAR WEIGHT; PARAMETER ESTIMATION; RELAXATION TIME;

BROADBAND DIELECTRIC SPECTROSCOPY; CHEMICAL DEGRADATION; POLYMER CHAIN MOTIONS; VOGEL TEMPERATURE;

THIN FILMS;

EID: 34548675787     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2007.04.032     Document Type: Article

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