Reliability of spring pressure contacts under environmental stress

Microelectronics Reliability

Volumn 47, Issue 9-11 SPEC. ISS., 2007, Pages 1761-1766

  Lang, F ^a   Scheuermann, U ^a  

^a Semikron Elektronik GmbH AndCo KG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC LOADS; ENVIRONMENTAL IMPACT; PRINTED CIRCUIT BOARDS; RELIABILITY;

CORROSIVE ATMOSPHERE; CURRENT RANGE; SENSOR CURRENTS;

ELECTRIC CONTACTS;

EID: 34548672588     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2007.07.038     Document Type: Article

References (2)

1. Slade P. Electrical Contacts - Principles and Applications (1999), Marcel Dekker, New York
2. Andus electronic [Online], Available: ; 2006 [accessed 21.03.2006].