Interface formation and growth of a thin film of ZnPcCl8/Ag(1 1 1) studied by photoelectron spectroscopy

Surface Science

Volumn 601, Issue 18, 2007, Pages 4185-4188

  Amsalem, P ^a   Giovanelli, L ^a   Themlin, J M ^a   Koudia, M ^a   Abel, M ^a   Oison, V ^a   Ksari, Y ^a   Mossoyan, M ^a   Porte, L ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

Chemisorption; Interface dipole; Metal semiconductor interfaces; Organic semiconductors; Photoelectron spectroscopy; Self assembly; Silver; Work function measurements

Indexed keywords

CHARGE TRANSFER; CHEMISORPTION; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; FERMI LEVEL; FILM GROWTH; PHOTOELECTRON SPECTROSCOPY; SELF ASSEMBLY; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILMS; WORK FUNCTION;

INTERFACE DIPOLES; METAL SEMICONDUCTOR INTERFACES; WORK FUNCTION MEASUREMENTS;

ZINC COMPOUNDS;

EID: 34548624002     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.04.080     Document Type: Article

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