Critical current densities and the structural quality of 3- and 4-μm -thick superconducting YBa2Cu3O7 layers synthesized using the ex situ process

Journal of Applied Physics

Volumn 102, Issue 5, 2007, Pages

  Solovyov, Vyacheslav F ^a   Wiesmann, Harold J ^a   Suenaga, Masaki ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); GRAIN SIZE AND SHAPE; METALLOGRAPHY; NUCLEATION; SUPERCONDUCTING FILMS; X RAY DIFFRACTION;

DIFFRACTION LINE; EX SITU PROCESS; OPTICAL METALLOGRAPHY; STRUCTURAL QUALITY;

YTTRIUM BARIUM COPPER OXIDES;

EID: 34548623184     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2773997     Document Type: Article

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