Modified shewhart charts for high yield processes

Journal of Applied Statistics

Volumn 34, Issue 7, 2007, Pages 857-877

  Chang, Tee Chin ^a   Gan, Fah Fatt ^b  

^a GLAXOSMITHKLINE   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Average run length; Binomial counts; Parts per million non conforming items; Statistical process control; Supplementary runs rules

Indexed keywords

EID: 34548567298     PISSN: 02664763     EISSN: 13600532     Source Type: Journal    
DOI: 10.1080/02664760701546279     Document Type: Review

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