Face recognition using landmark-based bidimensional regression

Proceedings - IEEE International Conference on Data Mining, ICDM

Volumn , Issue , 2005, Pages 765-768

  Jiazheng, Shi ^a   Samal, Ashok ^a   Marx, David ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; EIGENVALUES AND EIGENFUNCTIONS; FEATURE EXTRACTION; PRINCIPAL COMPONENT ANALYSIS; REGRESSION ANALYSIS;

BIDIMENSIONAL REGRESSION;

FACE RECOGNITION;

EID: 34548566212     PISSN: 15504786     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICDM.2005.61     Document Type: Conference Paper

References (8)

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