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Volumn 46, Issue 21, 2007, Pages 4674-4679

Fast line-shape correction procedure for imaging Fourier-transform spectrometers

Author keywords

[No Author keywords available]

Indexed keywords

CCD CAMERAS; FOURIER TRANSFORMS; IMAGING SYSTEMS; MONOCHROMATORS; PIXELS; SPECTROMETERS;

EID: 34548556120     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.004674     Document Type: Article
Times cited : (7)

References (14)
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  • 2
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    • E. Niple, A. Pires, and K. Poultney, "Exact modeling of lineshape and wavenumber variations for off-axis detectors in Fourier-transform spectrometers (FTS) sensor systems," in Technologies of Cryogenically Cooled Sensors and Fourier Transform Spectrometers II, R. J. Huppi, ed. Proc. SPIE 0364, 11-20 (1982).
  • 3
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    • Matrix form for the instrument line shape of Fourier-transform spectrometers yielding a fast integration algorithm to theoretical spectra
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  • 4
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  • 5
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    • Instrument line shape of Fouriertransform spectrometers: Analytic solutions for nonuniformly illuminated off-axis detectors
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    • Genest, J.1    Tremblay, P.2
  • 6
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    • Application of a nonuniform spectral resampling transform in Fourier-transform spectrometry
    • E. Sarkissian and K. W. Bowman, "Application of a nonuniform spectral resampling transform in Fourier-transform spectrometry," Appl. Opt. 42, 1122-1131 (2003).
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  • 7
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    • Wavelength calibration of Fourier-transform emission spectra with applications to Fe I
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  • 8
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  • 9
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    • A. Kuze, H. Nakajima, J. Tanii, and Y. Sasano, "Conceptual design of solar occultation FTS for inclined-orbit satellite (SOFIS) on GCOM-A1," in Infrared Spaceborne Remote Sensing VIII, Proc. SPIE 4131, 4541-4548 (2000).
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  • 12
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.