Smart sensors for monitoring crack growth under fatigue loading conditions

Smart Structures and Systems

Volumn 2, Issue 2, 2006, Pages 101-113

  Giurgiutiu, Victor ^a   Xu, Buli ^a   Chao, Yuh ^a   Liu, Shu ^a   Gaddam, Rishi ^a  

^a The Department of Mechanical Engineering   (United States)

Author keywords

Arcan specimen; Crack growth; Electromechanical impedance; Fatigue loading; Lamb wave; Piezoelectric wafer active sensor; Pitch catch

Indexed keywords

CRACK PROPAGATION; CRACK TIPS; DAMAGE DETECTION; FATIGUE CRACK PROPAGATION; PIEZOELECTRICITY; STRUCTURAL HEALTH MONITORING; SURFACE WAVES; TRANSMISSIONS; ULTRASONIC WAVES; WAVE PROPAGATION; WAVE TRANSMISSION;

ARCAN SPECIMEN; ELECTROMECHANICAL IMPEDANCE; FATIGUE LOADINGS; PIEZOELECTRIC WAFER ACTIVE SENSORS; PITCH-CATCH;

FATIGUE OF MATERIALS;

EID: 34548554559     PISSN: 17381584     EISSN: 17381991     Source Type: Journal    
DOI: 10.12989/sss.2006.2.2.101     Document Type: Conference Paper

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