Precision measurement of the 3 d → 2 p x-ray energy in kaonic 4He

Physics Letters, Section B: Nuclear, Elementary Particle and High-Energy Physics

Volumn 653, Issue 5-6, 2007, Pages 387-391

  Okada, S ^a   Beer, G ^b   Bhang, H ^c   Cargnelli, M ^d   Chiba, J ^e   Choi, Seonho ^c   Curceanu, C ^f   Fukuda, Y ^g   Hanaki, T ^e   Hayano, R S ^h   Iio, M ^a   Ishikawa, T ^h   Ishimoto, S ⁱ   Ishiwatari, T ^d   Itahashi, K ^a   Iwai, M ⁱ   Iwasaki, M ^a,g   Juhasz B ^d   Kienle, P ^d,j   Marton, J ^d   Matsuda, Y ^a   Ohnishi, H ^a   Outa, H ^a   Sato, M ^g   Schmid, P ^d   Suzuki, S ⁱ   Suzuki, T ^a   Tatsuno, H ^h   Tomono, D ^a   Widmann, E ^d   Yamazaki, T ^a,h   Yim, H ^c   Zmeskal, J ^d   more..

^a RIKEN   (Japan)

^b UNIVERSITY OF VICTORIA   (Canada)

^c Seoul National University   (South Korea)

^d STEFAN MEYER INSTITUTE FOR SUBATOMIC PHYSICS   (Austria)

^e TOKYO UNIVERSITY OF SCIENCE   (Japan)

^f INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

^g TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^h UNIVERSITY OF TOKYO   (Japan)

ⁱ HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

^j TECHNICAL UNIVERSITY OF MUNICH   (Germany)

more..

Author keywords

Kaonic atom; Silicon drift detector; X ray spectroscopy

Indexed keywords

EID: 34548524491     PISSN: 03702693     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physletb.2007.08.032     Document Type: Article

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