Investigation of the structural transformation behavior of Ge2 Sb2 Te5 thin films using high resolution electron microscopy

Applied Physics Letters

Volumn 91, Issue 10, 2007, Pages

  Kim, Eun Tae ^a   Lee, Jeong Yong ^a   Kim, Yong Tae ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; EPITAXIAL GROWTH; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; METASTABLE PHASES; STRUCTURAL ANALYSIS;

STRUCTURAL TRANSFORMATION; TETRAHEDRAL SITE; TWIN BOUNDARY; UMBRELLA-FLIP MOTION;

THIN FILMS;

EID: 34548486434     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2783478     Document Type: Article

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