Magnetic force microscopy of nano-size magnetic domain ordering in heavy ion irradiated fullerene films

Journal of Nanoscience and Nanotechnology

Volumn 7, Issue 6, 2007, Pages 2201-2205

  Kumar, Amit ^a   Avasthi, D K ^a   Pivin, J C ^b   Papaleo R M ^c   Tripathi, A ^a   Singh, F ^a   Sulania, I ^a  

^a INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^b Batiment 108   (France)

^c PONTIFICAL CATHOLIC UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

Fullerene; Ion irradiation; Magnetic domains; Magnetic force microscopy

Indexed keywords

CARBON PHASE; DOMAIN BOUNDARIES; FULLERENE FILMS; INDUCED MAGNETISM; ION FLUENCE; ION IRRADIATIONS; IRRADIATED FILMS; MAGNETIC (CE); MAGNETIC DOMAIN SIZES; MAGNETIC FORCES; MAGNETIC MEASUREMENTS; NANO SIZES; STRUCTURAL DEFECTS; SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE (SQUID);

AMORPHOUS CARBON; FULLERENES; IONS; MAGNETIC FORCE MICROSCOPY; MAGNETIC MATERIALS; MAGNETISM; MICROSCOPIC EXAMINATION; NANOSTRUCTURES; QUANTUM INTERFERENCE DEVICES; SUPERCONDUCTING FILMS; SUPERCONDUCTING MAGNETS;

MAGNETIC DOMAINS;

FULLERENE DERIVATIVE; HEAVY ION; NANOMATERIAL;

ARTICLE; ARTIFICIAL MEMBRANE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTROMAGNETIC FIELD; MACROMOLECULE; MAGNETISM; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; RADIATION EXPOSURE; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; ELECTROMAGNETIC FIELDS; FULLERENES; HEAVY IONS; MACROMOLECULAR SUBSTANCES; MAGNETICS; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; MICROSCOPY, ATOMIC FORCE; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTIES;

EID: 34548434338     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2007.795     Document Type: Conference Paper

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