-
1
-
-
0004150157
-
-
Bruker AXS Inc, Madison, Wisconsin, USA
-
Bruker (1998). SHELXTL. Bruker AXS Inc., Madison, Wisconsin, USA.
-
(1998)
SHELXTL
-
-
Bruker1
-
5
-
-
0037076054
-
-
Ishikawa, H., Iwata, K. & Hamaguchi, H. (2002). J. Phys. Chem. A, 106, 2305-2312.
-
(2002)
J. Phys. Chem. A
, vol.106
, pp. 2305-2312
-
-
Ishikawa, H.1
Iwata, K.2
Hamaguchi, H.3
-
6
-
-
0037198458
-
-
Jin, Z. M., Pan, Y. J., Hu, M. L. & Zhou, J. W. (2002). J. Mol. Struct. 609, 83-87.
-
(2002)
J. Mol. Struct
, vol.609
, pp. 83-87
-
-
Jin, Z.M.1
Pan, Y.J.2
Hu, M.L.3
Zhou, J.W.4
-
7
-
-
0034144747
-
-
Jin, Z. M., Pan, Y. J., Liu, J. G. & Xu, D. J. (2000). J. Chem. Crystallogr. 30, 195-198.
-
(2000)
J. Chem. Crystallogr
, vol.30
, pp. 195-198
-
-
Jin, Z.M.1
Pan, Y.J.2
Liu, J.G.3
Xu, D.J.4
-
8
-
-
34548282058
-
-
Kaminskii, A. A., Bohatý, L., Becker, P., Eichler, H. J., Rhee, H., Maczka, M. & Hanuza, J. (2007). Laser Phys. Lett. 4, 291-303.
-
(2007)
Laser Phys. Lett
, vol.4
, pp. 291-303
-
-
Kaminskii, A.A.1
Bohatý, L.2
Becker, P.3
Eichler, H.J.4
Rhee, H.5
Maczka, M.6
Hanuza, J.7
-
9
-
-
34247114790
-
-
Kaminskii, A. A., Bohatý, L., Becker, P., Held, P., Eichler, H. J., Rhee, H., Hanuza, J. & Maczka, M. (2006). Laser Phys. Lett. 3, 490-494.
-
(2006)
Laser Phys. Lett
, vol.3
, pp. 490-494
-
-
Kaminskii, A.A.1
Bohatý, L.2
Becker, P.3
Held, P.4
Eichler, H.J.5
Rhee, H.6
Hanuza, J.7
Maczka, M.8
-
10
-
-
33747778355
-
-
Kiebacha, R., Näthera, C., Sebastian, C. P., Mosel, B. D., Pöttgen, R. & Bensch, W (2006). J. Solid State Chem. 179, 3082-3086.
-
(2006)
J. Solid State Chem
, vol.179
, pp. 3082-3086
-
-
Kiebacha, R.1
Näthera, C.2
Sebastian, C.P.3
Mosel, B.D.4
Pöttgen, R.5
Bensch, W.6
-
11
-
-
0001385822
-
-
Sarma, J. A. R. P., Allen, F. H., Hoy, V. J., Howard, J. A. K., Thaimattam, R., Biradhad, K. & Desiraju, G. R. (1997). J. Chem Soc. Chem. Commun. pp. 101-102.
-
(1997)
J. Chem Soc. Chem. Commun
, pp. 101-102
-
-
Sarma, J.A.R.P.1
Allen, F.H.2
Hoy, V.J.3
Howard, J.A.K.4
Thaimattam, R.5
Biradhad, K.6
Desiraju, G.R.7
-
13
-
-
34548462367
-
-
Siemens 1994, XSCANS. Version 2.1, Siemens Analytical X-ray Instruments Inc, Madison, Wisconsin, USA
-
Siemens (1994). XSCANS. Version 2.1, Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
-
-
-
14
-
-
0033533587
-
-
Thalladi, V. R., Boese, R., Brasselet, S., Ledoux, I., Zyss, J., Jettic, R. K. R. & Desiraju, G. R. (1999). Chem. Commun. pp. 1639-1640.
-
(1999)
Chem. Commun
, pp. 1639-1640
-
-
Thalladi, V.R.1
Boese, R.2
Brasselet, S.3
Ledoux, I.4
Zyss, J.5
Jettic, R.K.R.6
Desiraju, G.R.7
-
15
-
-
18544389346
-
-
Xuan, R.-C., Wan, Y.-H., Hu, W.-X., Yang, Z.-Y., Cheng, D.-P. & Xuan, R.-R. (2003). Acta Cryst. E59, o1704-o1706.
-
(2003)
Acta Cryst. E
, vol.59
-
-
Xuan, R.-C.1
Wan, Y.-H.2
Hu, W.-X.3
Yang, Z.-Y.4
Cheng, D.-P.5
Xuan, R.-R.6
|