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Volumn 78, Issue 8, 2007, Pages

Electrostatic ion trap and Fourier transform measurements for high-resolution mass spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTROSTATICS; FOURIER TRANSFORMS; HARMONIC ANALYSIS; MASS SPECTROMETRY; XENON;

EID: 34548393210     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2777195     Document Type: Article
Times cited : (24)

References (17)
  • 2
    • 34548417072 scopus 로고
    • See, e.g., Phys. Scr., T T59 (1995) (entire issue); P. K. Ghosh, Ion Traps (Clarendon, Oxford, 1995).
    • (1995) Phys. Scr., T , vol.59
  • 3
    • 0003979343 scopus 로고
    • Clarendon, Oxford
    • See, e.g., Phys. Scr., T T59 (1995) (entire issue); P. K. Ghosh, Ion Traps (Clarendon, Oxford, 1995).
    • (1995) Ion Traps
    • Ghosh, P.K.1
  • 15
    • 0003391643 scopus 로고
    • 3rd ed. (Wiley, New York
    • A. Yariv, Quantum Electronics, 3rd ed. (Wiley, New York, 1989), p. 142.
    • (1989) Quantum Electronics , pp. 142
    • Yariv, A.1
  • 16
    • 34548420094 scopus 로고    scopus 로고
    • SIMION ver. 7.0, ion source software.
    • SIMION ver. 7.0, ion source software.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.