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Volumn , Issue , 2006, Pages 19-24

Variational interconnect delay metrics for statistical timing analysis

Author keywords

[No Author keywords available]

Indexed keywords

INTERCONNECT DELAY; ON-CHIP INTERCONNECTS; ORTHOGONAL POLYNOMIAL SERIES; PHYSICAL DESIGN; PROCESS VARIABLES; RECURSIVE EQUATIONS; SECOND ORDER DELAY; STATISTICAL TIMING ANALYSIS;

EID: 34548346740     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2006.143     Document Type: Conference Paper
Times cited : (9)

References (18)
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    • (2004) IEEE Trans. on Computer-Aided Design , vol.23 , Issue.5 , pp. 678-693
    • Daniel, L.1    Ong, C.S.2    Low, S.C.3    Lee, K.H.4    White, J.5
  • 6
    • 0029221808 scopus 로고
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    • Kahng, A.1    Muddu, S.2
  • 8
    • 0031645530 scopus 로고    scopus 로고
    • Primo: Probability interpretation of moments for delay calculation
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    • Kay, R.1    Pileggi, L.2
  • 9
    • 0032319161 scopus 로고    scopus 로고
    • H-gamma: An rc delay metric based on a gamma distirbution approximation to the homgeneous response
    • T. Lin, E. Acar, and L.Pileggi. h-gamma: An rc delay metric based on a gamma distirbution approximation to the homgeneous response. In IEEE/ACM Design Automation Conf., 1998.
    • (1998) IEEE/ACM Design Automation Conf.
    • Lin, T.1    Acar, E.2    Pileggi, L.3
  • 10
    • 0036907238 scopus 로고    scopus 로고
    • A delay metric for rc circuits basedon the weibull distribution
    • F. Liu, C. Kashyap, and C. Alpert. A delay metric for rc circuits basedon the weibull distribution. In Intl. Conf. on Computer-Aided Design, pages 620-624, 2002.
    • (2002) Intl. Conf. on Computer-Aided Design , pp. 620-624
    • Liu, F.1    Kashyap, C.2    Alpert, C.3
  • 15
    • 0034833288 scopus 로고    scopus 로고
    • Modeling and analysis of manufacturing variations
    • S.R.Nassif. Modeling and analysis of manufacturing variations. In CICC, pages 223-228, 2001.
    • (2001) CICC , pp. 223-228
    • Nassif, S.R.1
  • 16
    • 0032272981 scopus 로고    scopus 로고
    • Modeling the effects of manufacturing variation on high-speed micrioporcessor interconnect performance
    • V.Mehrortra, S. Nassif, D. Boning, and J. Chung. Modeling the effects of manufacturing variation on high-speed micrioporcessor interconnect performance. In IEEE Electron Devices Mettings, pages 767-770, 1998.
    • (1998) IEEE Electron Devices Mettings , pp. 767-770
    • Mehrortra, V.1    Nassif, S.2    Boning, D.3    Chung, J.4
  • 17
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    • Stochastic analysis of interconnect performance in the presence of process variations
    • Nov
    • J. Wang, P.Ghanta, and S.Vrudhula. Stochastic analysis of interconnect performance in the presence of process variations. In Intl. Conf. on Computer-Aided Design, pages 880-886, Nov. 2004.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.