A Sparse Grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2007, Pages 1514-1519

  Zhu, Hengliang ^a   Zeng, Xuan ^a   Cai, Wei ^b   Xue, Jintao ^a   Zhou, Dian ^a,c  

^a FUDAN UNIVERSITY   (China)

^b UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE   (United States)

^c UNIVERSITY OF TEXAS AT DALLAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CONVERGENCE OF NUMERICAL METHODS; INTERCONNECTION NETWORKS; PERTURBATION TECHNIQUES; RANDOM PROCESSES;

COMPUTATION COST; NANOMETER PROCESS TECHNOLOGY; SPARSE GRID; SPECTRAL STOCHASTIC COLLOCATION METHOD (SSCM);

SPECTRUM ANALYSIS;

EID: 34548318963     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2007.364515     Document Type: Conference Paper

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