Detection of faint X-ray spectral features using wavelength, energy, and spatial discrimination techniques

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 580, Issue 1 SPEC. ISS., 2007, Pages 33-36

  Hudson, L T ^a   Gillaspy, J D ^a   Pomeroy, J M ^a   Szabo, C I ^a   Tan, J N ^a   Radics, B ^b   Takacs, E ^b   Chantler, C T ^c   Kimpton, J A ^c   Kinnane, M N ^c   Smale, L F ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF DEBRECEN   (Hungary)

^c UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

CCD imaging; Cosmic ray removal; Crystal spectroscopy; Highly charged ions; X ray spectroscopy

Indexed keywords

CHARGE COUPLED DEVICES; COSMIC RAYS; ELECTRON BEAMS; GERMANIUM; IMAGE ANALYSIS; IONS; SILICON; WAVELENGTH;

COSMIC RAY REMOVAL; CRYSTAL SPECTROSCOPY; ELECTRON BEAM ION TRAP (EBIT); SPATIAL DISCRIMINATION; X-RAY SPECTROSCOPY;

X RAY SPECTROSCOPY;

EID: 34548312234     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.05.034     Document Type: Article

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