In-plane lattice parameter determination of Zn: LiNbO 3 thin films epitaxially grown on x-cut LiNbO 3 substrates using X-ray diffraction methods

Physica Status Solidi (A) Applications and Materials Science

Volumn 204, Issue 8, 2007, Pages 2585-2590

  Krausslich J ^a   Dubs, C ^a,b   Lorenz, A ^a,b   Tunnermann A ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b BIOMATERIALS DEPARTMENT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

PSEUDOMORPHOUS GROWTH; SPACE MEASUREMENTS;

DOPING (ADDITIVES); ELECTROOPTICAL DEVICES; FILM THICKNESS; INTEGRATED OPTICS; LATTICE CONSTANTS; LIQUID PHASE EPITAXY; LITHIUM COMPOUNDS; X RAY DIFFRACTION; ZINC;

THIN FILMS;

EID: 34548260754     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200675661     Document Type: Article

References (11)

1. J.-P. Ruske, B. Zeitner, A. Tünnermann, and A. S. Rasch, Electron. Lett. 39, 1048 (2003).
2. J.-P. Ruske, A. Tünnermann, and Th. Fehn, Laser Photonik, (2) 34-36 (2004).
3. M. Iwai, T. Yoshino, S. Yamaguchi, M. Imaeda, N. Pavel, I. Shoji, and T. Taira, Appl. Phys. Lett. 83, 3659 (2003).
4. T. Kawaguchi, K. Mizuuchi, T. Yoshino, M. Imaeda, K. Yamamoto, and T. Fukuda, J. Cryst. Growth 203, 173 (1999).
5. C. Dubs, A. Lorenz, J.-P. Ruske, J. Fuchs, and A. Tünnermann, Z. Kristallogr, Suppl. Issue 22, 52 (2005).
6. T. Volk, B. Maximov, T. Chernaya, N. Rubinina, M. Wöhlecke, and V. Simonov, Appl. Phys. B 72, 647 (2001).
7. S. C. Abrahams, J. M. Reddy, and J. L. Bernstein, J. Phys. Chem. Solids 27, 997 (1966).
8. V. Holy, U. Pietsch, and T. Baumbach, High-Resolution X-Ray Scattering from Thin Films and Multilayers, Springer Tracts in Modern Physics, Vol. 149 (Springer-Verlag, Berllin, Heidelberg, New York, 1999), chap. 3.2.
9. D. K. Bowen and B. K. Tanner, High Resolution X-Ray Diffraction and Topography (Taylor & Francis Ltd, London, 1998), chap. 7.7.
10. W. Kleber, K. Meyer, and W. Schoenborn, Einführung in die Kristallphysik (Akademie-Verlag, Berlin, 1968), chap. 2.1.4.
11. R. S. Weise and T. K. Gaylord, Appl. Phys. A, Mater. Sci. Process. 37, 191 (1985).