X-ray diffraction peaks from misfit dislocations in double- and triple-crystal diffractometry

Physica Status Solidi (A) Applications and Materials Science

Volumn 204, Issue 8, 2007, Pages 2561-2566

  Kaganer, Vladimir M ^a   Shalimov, Artem ^b   Bak Misiuk, Jadwiga ^b   Ploog, Klaus H ^a  

^a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

^b INSTITUTE OF PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

DOUBLE-CRYSTAL MEASUREMENTS; GLANCING INCIDENCE;

DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; SEMICONDUCTING GALLIUM ARSENIDE; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CRYSTAL STRUCTURE;

EID: 34548241685     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200675657     Document Type: Article

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