Measurement of the effective atomic number of composite materials using Rayleigh to Compton scattering of 279 keV gamma rays

Physica Scripta

Volumn 76, Issue 4, 2007, Pages 281-286

  Singh, M P ^a   Sandhu, B S ^a   Singh, Bhajan ^a  

^a PUNJABI UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

COMPTON SCATTERING; GAMMA RAYS; PROTONS; RAYLEIGH SCATTERING; SEMICONDUCTOR DETECTORS;

ATOMIC NUMBER; BAKELITE; PHOTO-PEAK EFFICIENCY; SOLDERING MATERIALS;

COMPOSITE MATERIALS;

EID: 34548202256     PISSN: 00318949     EISSN: 14024896     Source Type: Journal    
DOI: 10.1088/0031-8949/76/4/001     Document Type: Article

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